Atomic Force microscope
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Revision as of 19:46, 20 May 2009 by 122.167.147.175 (talk) (Created page with 'The Atomic Force Microscope *Different from the other microscopes because it doesn't use a lens for imaging. Rather, it uses a cantilever that is can detect up to a nanometer d...')
The Atomic Force Microscope
- Different from the other microscopes because it doesn't use a lens for imaging. Rather, it uses a cantilever that is can detect up to a nanometer deflection in the surface texture of the object under scan.
- The deflection is measured using a laser spot reflected of the top of the cantilever.
